发明授权
- 专利标题: Device and method for position measurement
- 专利标题(中): 位置测量装置和方法
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申请号: US11905404申请日: 2007-09-28
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公开(公告)号: US07860273B2公开(公告)日: 2010-12-28
- 发明人: Nobuo Kochi , Tetsuji Anai , Hitoshi Otani , Hirokazu Sato
- 申请人: Nobuo Kochi , Tetsuji Anai , Hitoshi Otani , Hirokazu Sato
- 申请人地址: JP Tokyo
- 专利权人: Topcon Corporation
- 当前专利权人: Topcon Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Foley & Lardner LLP
- 优先权: JP2006-267073 20060929
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; H04N5/225
摘要:
A position measurement device is provided that can precisely measure the photographing position or posture of a photographing device or the coordinates of an object based on sequentially changing photographed images. A position measuring device 100 of the invention comprises: an image acquisition section 2 for acquiring a series of photographed images changing continuously or little by little along with position displacement relative to an object to be photographed; a positional relationship measurement section 9 for measuring position displacement and posture change of the image acquisition section 2; a feature extraction section 3 for extracting feature points from the photographed images obtained with the image acquisition section 2; a feature point tracking section 4 for tracking the feature points by searching corresponding points corresponding to the feature points on a plurality of the photographed images; an image selection section 61 for selecting an image to be processed from the series of photographed images based on a measurement result made with the positional relationship measurement section 9; and a position measurement section 7 for measuring the photographing position and the photographing posture of the image acquisition section 2 based on the image to be processed selected with the image selection section 61.
公开/授权文献
- US20080095402A1 Device and method for position measurement 公开/授权日:2008-04-24
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