发明授权
- 专利标题: Inspection apparatus
- 专利标题(中): 检验仪器
-
申请号: US11801417申请日: 2007-05-09
-
公开(公告)号: US07860620B2公开(公告)日: 2010-12-28
- 发明人: Kazuto Kojitani , Hiroshi Tasaki , Hiroshi Nakajima , Seiko Ito
- 申请人: Kazuto Kojitani , Hiroshi Tasaki , Hiroshi Nakajima , Seiko Ito
- 申请人地址: JP Kyoto
- 专利权人: OMRON Corporation
- 当前专利权人: OMRON Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: Osha Liang LLP
- 优先权: JP2006-130723 20060509; JP2007-085898 20070328
- 主分类号: G01M17/00
- IPC分类号: G01M17/00
摘要:
An inspection apparatus includes a discrimination function determination unit which determines whether or not a discrimination function forms an area including a discrimination sample. The discrimination function is used in non-parametric one-class discrimination. The discrimination sample is discriminated into a class as a single area in an input space where learning samples are plotted.
公开/授权文献
- US20070265743A1 Inspection apparatus 公开/授权日:2007-11-15