发明授权
- 专利标题: Intelligent integrated diagnostics
- 专利标题(中): 智能综合诊断
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申请号: US10577676申请日: 2004-10-29
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公开(公告)号: US07860682B2公开(公告)日: 2010-12-28
- 发明人: Kelvin Hamilton , Keith Brown , Nick Taylor , David Lane
- 申请人: Kelvin Hamilton , Keith Brown , Nick Taylor , David Lane
- 申请人地址: GB Edinburgh GB Edinburgh
- 专利权人: SeeByte, Ltd.,Heriot-Watt University
- 当前专利权人: SeeByte, Ltd.,Heriot-Watt University
- 当前专利权人地址: GB Edinburgh GB Edinburgh
- 优先权: GB0325560.1 20031031
- 国际申请: PCT/GB2004/004585 WO 20041029
- 国际公布: WO2005/045693 WO 20050519
- 主分类号: G06F17/00
- IPC分类号: G06F17/00
摘要:
A diagnostics system comprising a topological map of a target system that has nodes (38, 40, 42, 44, 46, 48) that correspond to components (29, 30, 32, 34, 36) of the target system and links that correspond to connections between the components. Associated with the topological map is a knowledge store (50) that has a structure that reflects or corresponds to that of the topological map. Included in this store (50) is a plurality of sections or libraries each of which is provided for storing design specific data associated with one of the nodes (38, 40, 42, 44, 46, 48) of the topological map. Data received from one or more sensors on the target system is included in the topological map, and used together with the design specific information in the knowledge store to diagnose faults.
公开/授权文献
- US20080059839A1 Intelligent Integrated Diagnostics 公开/授权日:2008-03-06
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