发明授权
- 专利标题： Method and apparatus for incrementally computing criticality and yield gradient
- 专利标题（中）： 递增计算临界和屈服梯度的方法和装置
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申请号： US11870672申请日： 2007-10-11
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公开(公告)号： US07861199B2公开(公告)日： 2010-12-28
- 发明人: Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
- 申请人： Chandramouli Visweswariah , Jinjun Xiong , Vladimir Zolotov
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 主分类号： G06F17/50
- IPC分类号： G06F17/50
摘要：
In one embodiment, the invention is a method and apparatus for incrementally computing criticality and yield gradient. One embodiment of a method for computing a diagnostic metric for a circuit includes modeling the circuit as a timing graph, determining a chip slack for the circuit, determining a slack of at least one diagnostic entity, and computing a diagnostic metric relating to the diagnostic entity(ies) from the chip slack and the slack of the diagnostic entity(ies).