Invention Grant
- Patent Title: Laser measuring device
- Patent Title (中): 激光测量装置
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Application No.: US12202645Application Date: 2008-09-02
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Publication No.: US07869006B2Publication Date: 2011-01-11
- Inventor: Hong Ki Kim , Chan Yong Park , Seung Won Lee , Sun Ki Min
- Applicant: Hong Ki Kim , Chan Yong Park , Seung Won Lee , Sun Ki Min
- Applicant Address: KR Gyunggi-do KR Gwangju
- Assignee: Samsung Electro-Mechanics Co., Ltd.,Wooriro Optical Telecom
- Current Assignee: Samsung Electro-Mechanics Co., Ltd.,Wooriro Optical Telecom
- Current Assignee Address: KR Gyunggi-do KR Gwangju
- Agency: McDermott Will & Emery LLP
- Priority: KR10-2007-0100359 20071005; KR10-2007-0100360 20071005
- Main IPC: G01C3/08
- IPC: G01C3/08

Abstract:
A laser measuring device maintains high responsivity irrespective of changes in surrounding environment, provides more correct measurement and long distance measurement due to reduced noise, and ensures the safety and reliability of a product. A first light emitter emits first wavelength light having a first wavelength. A second light emitter emits second wavelength light having a second wavelength, the second light emitter being arranged perpendicular to the first light emitter. An optical mirror allows one of the first wavelength light and the second wavelength light to pass but reflecting the other one. A first band pass filter for allows the first wavelength light to pass. A second band pass filter allows the second wavelength light to pass. A light receiver receives incident light, which arrives through one of the first and second band pass filters. A controller activates at least one of the first and second light emitters.
Public/Granted literature
- US20090091739A1 LASER MEASURING DEVICE Public/Granted day:2009-04-09
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