Invention Grant
- Patent Title: Methods and apparatus for x-ray imaging with focal spot deflection
- Patent Title (中): 焦点偏转X射线成像的方法和装置
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Application No.: US12324348Application Date: 2008-11-26
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Publication No.: US07869571B2Publication Date: 2011-01-11
- Inventor: Jiang Hsieh , Eugne Lino Saragnese , J. Eric Stahre , Bijan Dorri , James Kaufman , Robert Franklin Senzig
- Applicant: Jiang Hsieh , Eugne Lino Saragnese , J. Eric Stahre , Bijan Dorri , James Kaufman , Robert Franklin Senzig
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Small Patent Law Group
- Agent Dean Small
- Main IPC: H01J35/08
- IPC: H01J35/08 ; H01J35/10 ; H05G1/60
Abstract:
Methods and apparatus for x-ray imaging with focal spot deflection are provided. The apparatus includes an x-ray tube having a cathode configured to emit electrons and an anode having a target with a target surface defining a target angle. The emitted electrons are deflected onto the target surface with the target surface substantially aligned with a z-axis parallel to a gantry rotation axis.
Public/Granted literature
- US20100067651A1 METHODS AND APPARATUS FOR X-RAY IMAGING WITH FOCAL SPOT DEFLECTION Public/Granted day:2010-03-18
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