发明授权
US07872676B2 Methods, systems, and devices for offset compensation in CMOC imagers
有权
用于CMOS成像器偏移补偿的方法,系统和设备
- 专利标题: Methods, systems, and devices for offset compensation in CMOC imagers
- 专利标题(中): 用于CMOS成像器偏移补偿的方法,系统和设备
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申请号: US11777442申请日: 2007-07-13
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公开(公告)号: US07872676B2公开(公告)日: 2011-01-18
- 发明人: Espen A. Olsen , Chiajen M. Lee , Christopher Zeleznik
- 申请人: Espen A. Olsen , Chiajen M. Lee , Christopher Zeleznik
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Traskbritt
- 主分类号: H04N5/76
- IPC分类号: H04N5/76 ; H04N5/217 ; H04N9/64 ; H04N5/335 ; H01L27/00
摘要:
Methods, devices, and systems for offset compensation in an amplifier are disclosed, wherein the amplifier inputs may be exposed to large loads from an array of pixel columns coupled in parallel. During a sampling phase, an amplifier offset may be sampled by selectively coupling a first amplifier output to a first amplifier input and a second amplifier output to a second amplifier input. During a portion of the sampling phase, the first amplifier output may be buffered to a first storage element. During a different portion of the sampling phase, the second amplifier output may be buffered to a second storage element. To sense the pixel columns during an amplification phase, the first storage element and the second storage element are coupled to the first and second amplifier inputs, respectively, with the result that the amplifier offset is canceled from the amplifier output.
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