发明授权
- 专利标题： Real-time, 3D, non-linear microscope measuring system and method for application of the same
- 专利标题（中）： 实时，3D，非线性显微镜测量系统及其应用方法
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申请号： US11814917申请日： 2006-01-27
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公开(公告)号： US07872748B2公开(公告)日： 2011-01-18
- 发明人: Szilveszter E. Vizi , Róbert Szipöcs , Balázs Rózsa , Pál Maák , Júlia Fekete , László Valenta , Gergely Katona , Péter Kalló , Károly Osvay
- 申请人： Szilveszter E. Vizi , Róbert Szipöcs , Balázs Rózsa , Pál Maák , Júlia Fekete , László Valenta , Gergely Katona , Péter Kalló , Károly Osvay
- 代理机构： Birch, Stewart, Kolasch & Birch, LLP
- 优先权： HU0500143 20050127
- 国际申请： PCT/HU2006/000009 WO 20060127
- 国际公布： WO2006/079861 WO 20060803
- 主分类号： G01N21/64
- IPC分类号： G01N21/64
摘要：
A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photochemically stimulate pre-selected points within a short time interval. The system further comprises a bundle of fibers composed of optical fibers or other waveguides, a rapidly working optical switch, a imaging system, a light source and an optical system. The examining optical signal is a fluorescent or other optical signal imaged on the required spot.
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