发明授权
- 专利标题: Apparatus and method for classifying defects using multiple classification modules
- 专利标题(中): 使用多个分类模块分类缺陷的装置和方法
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申请号: US10809464申请日: 2004-03-26
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公开(公告)号: US07873205B2公开(公告)日: 2011-01-18
- 发明人: Hirohito Okuda , Yuji Takagi , Toshifumi Honda , Atsushi Miyamoto , Takehiro Hirai
- 申请人: Hirohito Okuda , Yuji Takagi , Toshifumi Honda , Atsushi Miyamoto , Takehiro Hirai
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 优先权: JP2003-089686 20030328
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
A classification model optimum for realization of a defect classification request by a user is not known by the user. Then, the user sets a classification model which is not necessarily suitable and makes classification, resulting in degradation in classification performance. Therefore, the present invention automatically generates plural potential classification models and combines class likelihoods calculated from the plural classification models to classify. To combine, an index about the adequacy of each model, in other words, an index indicating a reliable level of likelihood calculated from the each potential classification model, is also calculated. Considering the calculated result, the class likelihoods calculated from the plural classification models are combined to execute classification.
公开/授权文献
- US20040252878A1 Method and its apparatus for classifying defects 公开/授权日:2004-12-16
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