Invention Grant
- Patent Title: Gate array
- Patent Title (中): 门阵列
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Application No.: US11600829Application Date: 2006-11-17
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Publication No.: US07875909B2Publication Date: 2011-01-25
- Inventor: Hirofumi Uchida
- Applicant: Hirofumi Uchida
- Applicant Address: JP Tokyo
- Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Volentine & Whitt, P.L.L.C.
- Priority: JP2005-368388 20051221
- Main IPC: H01L27/10
- IPC: H01L27/10

Abstract:
A gate array of a semiconductor substrate on which plural unit cells are arranged in parallel, the unit cells having the same pattern that includes a source potential region VDD, a PMOS, an NMOS and a ground potential region GND. Metal wiring lines being formed, with an insulating layer between, on the unit cells, with contacts that make electrical connection between the metal wiring lines and the unit cell transistors. The gate wiring of a transistor in a non-used unit cell is used in place of a metal wiring line. By doing so, the area of metal wiring lines in a gate array is reduced and the array wiring efficiency is increased.
Public/Granted literature
- US20070138510A1 Gate array Public/Granted day:2007-06-21
Information query
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