Invention Grant
- Patent Title: Temperature detection circuit
- Patent Title (中): 温度检测电路
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Application No.: US12378190Application Date: 2009-02-11
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Publication No.: US07880528B2Publication Date: 2011-02-01
- Inventor: Atsushi Igarashi
- Applicant: Atsushi Igarashi
- Applicant Address: JP
- Assignee: Seiko Instruments Inc.
- Current Assignee: Seiko Instruments Inc.
- Current Assignee Address: JP
- Agency: Adams & Wilks
- Priority: JP2008-036433 20080218
- Main IPC: H01L35/00
- IPC: H01L35/00 ; H01L37/00 ; H03K3/42 ; H03K17/87

Abstract:
A temperature detection circuit has a first temperature sensor circuit that outputs a voltage having a negative temperature gradient and an absolute value and a second temperature sensor circuit that outputs a voltage having a positive temperature gradient and the same absolute value as that for the output voltage of the first temperature sensor circuit. A switch circuit conducts a switching operation in accordance with a control signal to switch between outputting the output voltage of the first temperature sensor circuit and the output voltage of the second temperature sensor circuit. A comparison circuit compares the output voltage from the first or second temperature sensor circuit with a reference voltage. A logic circuit outputs a temperature detection signal on the basis of the control signal and an output signal from the comparison circuit.
Public/Granted literature
- US20090206912A1 Temperature detection circuit Public/Granted day:2009-08-20
Information query
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