发明授权
- 专利标题： Reference data optimization learning method and pattern recognition system
- 专利标题（中）： 参考数据优化学习方法和模式识别系统
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申请号： US11508901申请日： 2006-08-24
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公开(公告)号： US07881525B2公开(公告)日： 2011-02-01
- 发明人: Hans Jurgen Mattausch , Tetsushi Koide , Yoshinori Shirakawa
- 申请人： Hans Jurgen Mattausch , Tetsushi Koide , Yoshinori Shirakawa
- 申请人地址： JP Higashihiroshima-shi
- 专利权人： Hiroshima University
- 当前专利权人： Hiroshima University
- 当前专利权人地址： JP Higashihiroshima-shi
- 代理机构： Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权： JP2004-053433 20040227
- 主分类号： G06K9/00
- IPC分类号： G06K9/00
摘要：
The present invention is directed to a pattern recognition system in which new reference data to be added is efficiently learned. In the pattern recognition system, there is performed the calculation of distances equivalent to similarities between input data of a pattern search target and a plurality of reference data, and based on input data of a fixed number of times corresponding to the reference data set as a recognized winner, a gravity center thereof is calculated to optimize the reference data. Furthermore, a threshold value is changed to enlarge/reduce recognition areas, whereby erroneous recognition is prevented and a recognition rate is improved.