Invention Grant
- Patent Title: Probe calibration
- Patent Title (中): 探头校准
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Application No.: US11918492Application Date: 2006-04-25
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Publication No.: US07885777B2Publication Date: 2011-02-08
- Inventor: Kevyn Barry Jonas , Jean-Louis Grzesiak , Geoffrey McFarland
- Applicant: Kevyn Barry Jonas , Jean-Louis Grzesiak , Geoffrey McFarland
- Applicant Address: GB Wotton-Under-Edge
- Assignee: Renishaw PLC
- Current Assignee: Renishaw PLC
- Current Assignee Address: GB Wotton-Under-Edge
- Agency: Oliff & Berridge PLC
- Priority: GB0508390.2 20050426; GB0508402.5 20050426
- International Application: PCT/GB2006/001502 WO 20060425
- International Announcement: WO2006/114603 WO 20061102
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G01B5/004

Abstract:
A method of calibrating a probe is disclosed said probe being mounted on a machine and having a stylus with a workpiece contacting tip, comprising calculating calibration information for the probe for a first orientation of the probe, and rotating the calibration information by an angle to obtain a probe calibration information for when the probe is oriented by that angle with respect to the first orientation. Also disclosed is a method of calibrating a probe during a measurement process. The calibration information may include a vector which relates probe head axes to machine axes; a calibration matrix; datum data; an inertial matrix. The stylus tip may be datumed at the orientation of the probe or inferred from datum information obtained at different orientations. The rotation step may be carried out by a software/computer program which may be stored on a controller for the machine.
Public/Granted literature
- US20090248345A1 Probe Calibration Public/Granted day:2009-10-01
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