发明授权
US07888237B2 Method of cutting semiconductor wafer, semiconductor chip apparatus, and chamber to cut wafer
有权
切割半导体晶片,半导体芯片装置和切割晶片的腔室的方法
- 专利标题: Method of cutting semiconductor wafer, semiconductor chip apparatus, and chamber to cut wafer
- 专利标题(中): 切割半导体晶片,半导体芯片装置和切割晶片的腔室的方法
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申请号: US12265165申请日: 2008-11-05
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公开(公告)号: US07888237B2公开(公告)日: 2011-02-15
- 发明人: Dong-Han Kim , Kyoung-Sei Choi , Chul-woo Kim
- 申请人: Dong-Han Kim , Kyoung-Sei Choi , Chul-woo Kim
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd
- 当前专利权人: Samsung Electronics Co., Ltd
- 当前专利权人地址: KR Suwon-si
- 代理机构: Stanzione & Kim LLP
- 优先权: KR10-2007-0112165 20071105
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
A method of cutting a semiconductor wafer includes preparing a semiconductor wafer including a scribe region and a chip region, forming a groove in the scribe region, loading the semiconductor wafer with the groove formed therein in a chamber, and cutting the semiconductor wafer into a plurality of chips through increasing a pressure of the chamber by a first pressure change rate, and then reducing the pressure of the chamber by a second pressure change rate.
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