发明授权
- 专利标题: Radiological measurement system and radiological imaging system
- 专利标题(中): 放射学测量系统和放射成像系统
-
申请号: US12388263申请日: 2009-02-18
-
公开(公告)号: US07888648B2公开(公告)日: 2011-02-15
- 发明人: Tomoyuki Seino , Takafumi Ishitsu , Yuichiro Ueno
- 申请人: Tomoyuki Seino , Takafumi Ishitsu , Yuichiro Ueno
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Brundidge & Stanger, P.C.
- 优先权: JP2008-090842 20080331
- 主分类号: G01T1/24
- IPC分类号: G01T1/24
摘要:
A radiological measurement system protecting an amplifier from damage caused by a surge current, ensuring temporal continuity of measurement with a minimum dead time, and including a high voltage DC supply for applying a bias voltage to a radiation detector formed of semiconductor crystal, a controller for exercising on-off control on the bias voltage supplied from the high voltage DC supply, an amplifier, a protection circuit for protecting the amplifier from a surge current generated when the bias voltage is subjected to the on-off control, a control unit for preventing the surge current from flowing to the amplifier, and a switch provided in parallel with the protection circuit and controlled in operation state by the control unit, wherein the control unit controls the operation state of the switch in synchronism with the on-off control exercised by the control unit to prevent the surge current from flowing to the amplifier.
公开/授权文献
信息查询