发明授权
- 专利标题: Semiconductor devices including interlayer conductive contacts and methods of forming the same
- 专利标题(中): 包括层间导电触点的半导体器件及其形成方法
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申请号: US12080284申请日: 2008-04-02
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公开(公告)号: US07888798B2公开(公告)日: 2011-02-15
- 发明人: Jongwon Hong , GeumJung Seong , Jongmyeong Lee , Hyunbae Lee , Bonghyun Choi
- 申请人: Jongwon Hong , GeumJung Seong , Jongmyeong Lee , Hyunbae Lee , Bonghyun Choi
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Mills & Onello, LLP
- 优先权: KR10-2007-0047712 20070516; KR10-2007-0071781 20070718
- 主分类号: H01L23/48
- IPC分类号: H01L23/48 ; H01L23/52 ; H01L29/40
摘要:
In a semiconductor device and a method of forming the same, the semiconductor device comprises: a first insulating layer on an underlying contact region of the semiconductor device, the first insulating layer having an upper surface; a first conductive pattern in a first opening through the first insulating layer, an upper portion of the first conductive pattern being of a first width, an upper surface of the first conductive pattern being recessed relative to the upper surface of the first insulating layer so that the upper surface of the first conductive pattern has a height relative to the underlying contact region that is less than a height of the upper surface of the first insulating layer relative to the underlying contact region; and a second conductive pattern contacting the upper surface of the first conductive pattern, a lower portion of the second conductive pattern being of a second width that is less than the first width.
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