发明授权
- 专利标题: Method and apparatus for identifying pathology in brain images
- 专利标题(中): 用于识别脑图像病理学的方法和装置
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申请号: US10582725申请日: 2003-12-12
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公开(公告)号: US07889895B2公开(公告)日: 2011-02-15
- 发明人: Wieslaw Lucjan Nowinski , Qingmao Hu
- 申请人: Wieslaw Lucjan Nowinski , Qingmao Hu
- 申请人地址: SG Centros
- 专利权人: Agency for Science, Technology and Research
- 当前专利权人: Agency for Science, Technology and Research
- 当前专利权人地址: SG Centros
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 国际申请: PCT/SG03/00284 WO 20031212
- 国际公布: WO2005/057498 WO 20050623
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; A61B5/05
摘要:
A method and apparatus for identifying pathology in a brain image comprises the steps of firstly determining the location of the midsagittal plane (MSP) of the brain illustrated in the image under examination by identifying the symmetry of the two hemispheres based on the determination of up to 16 approximated fissure line segments (AFLSs). Those AFLSs with a larger angular deviation from the MSP than a predefined threshold are considered as outlier AFLSs while the rest are taken as inlier AFLSs. The ratio of the number of the outlier AFLSs to the number of inlier AFLSs is then calculated. A comparison of the ratio with a further predetermined threshold value is made and if the ratio exceeds the further predetermined threshold value, pathology is present in the brain image.
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