发明授权
- 专利标题: Device manufacturing method and computer program product
- 专利标题(中): 设备制造方法和计算机程序产品
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申请号: US11435296申请日: 2006-05-17
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公开(公告)号: US07897058B2公开(公告)日: 2011-03-01
- 发明人: Richard Johannes Franciscus Van Haren , Maurits Van Der Schaar , Ewoud Vreugdenhil , Harry Sewell
- 申请人: Richard Johannes Franciscus Van Haren , Maurits Van Der Schaar , Ewoud Vreugdenhil , Harry Sewell
- 申请人地址: NL Veldhoven NL Veldhoven
- 专利权人: ASML Netherlands B.V.,ASML Holding NV
- 当前专利权人: ASML Netherlands B.V.,ASML Holding NV
- 当前专利权人地址: NL Veldhoven NL Veldhoven
- 代理机构: Pillsbury Winthrop Shaw Pittman LLP
- 主分类号: C23F1/00
- IPC分类号: C23F1/00 ; G06F19/00 ; B44C1/22 ; G01L21/30
摘要:
A method of forming features, e.g. contact holes, at a higher density than is possible with conventional lithographic techniques involves forming an array of sacrificial positive features, conformally depositing a sacrificial layer so that negative features are formed interleaved with the positive features, directionally etching the sacrificial layer and removing the sacrificial features. The result is an array of holes at a higher density than the original sacrificial features. These may then be transferred into the underlying substrate using a desired process. Also, the method may be repeated to create arrays at even higher densities.
公开/授权文献
- US20070187358A1 Device manufacturing method and computer program product 公开/授权日:2007-08-16
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