Invention Grant
- Patent Title: System and method for high Z material detection
- Patent Title (中): 高Z材料检测系统及方法
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Application No.: US12272780Application Date: 2008-11-17
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Publication No.: US07897925B2Publication Date: 2011-03-01
- Inventor: Jacques Goldberg , Isaac Shpantzer , Yaakov Achiam , Nadejda Reingand
- Applicant: Jacques Goldberg , Isaac Shpantzer , Yaakov Achiam , Nadejda Reingand
- Applicant Address: US MD Silver Spring
- Assignee: CeLight, Inc.
- Current Assignee: CeLight, Inc.
- Current Assignee Address: US MD Silver Spring
- Agent Nadya Reingand
- Main IPC: G01N23/00
- IPC: G01N23/00 ; G01N23/201

Abstract:
A method and system for high Z material revealing using muon detection technique is presented. The system measures muons' coordinates, velocities, incidence angles and leaving angles. Two series of detectors: one above and one below the interrogated volume are used. A muon trajectory deviation from an expected trajectory is used for the decision making on the presence of high Z material inside the volume. The muon velocity is measured using either a ring Cerenkov counter, a transition radiation detector or/and a threshold Cerenkov counter. The expected trajectory is calculated basing on known particle velocity.
Public/Granted literature
- US20090224157A1 SYSTEM AND METHOD FOR HIGH Z MATERIAL DETECTION Public/Granted day:2009-09-10
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