发明授权
US07898086B2 Semiconductor device having a package base with at least one through electrode 有权
具有具有至少一个贯通电极的封装基底的半导体器件

  • 专利标题: Semiconductor device having a package base with at least one through electrode
  • 专利标题(中): 具有具有至少一个贯通电极的封装基底的半导体器件
  • 申请号: US11360570
    申请日: 2006-02-24
  • 公开(公告)号: US07898086B2
    公开(公告)日: 2011-03-01
  • 发明人: Yoshimi Egawa
  • 申请人: Yoshimi Egawa
  • 申请人地址: JP Tokyo
  • 专利权人: Oki Semiconductor Co., Ltd.
  • 当前专利权人: Oki Semiconductor Co., Ltd.
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Rabin & Berdo PC
  • 优先权: JP2005-053918 20050228
  • 主分类号: H01L29/40
  • IPC分类号: H01L29/40
Semiconductor device having a package base with at least one through electrode
摘要:
A through electrode extends through a silicon substrate from the upper surface to the lower surface of the substrate to accomplish electrical conduction between the upper and lower surfaces of the substrate. The through electrode includes a plurality of slender through holes formed in a through electrode forming area of the silicon substrate. The slender through holes extend through the silicon substrate from the upper surface to the lower surface of the silicon substrate. The through electrode also includes a plurality of conductive bodies fitted in the slender through holes. The conductive bodies are electrically connected with each other.
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