发明授权
- 专利标题: Method and program for selecting product to be inspected
- 专利标题(中): 选择待检查产品的方法和程序
-
申请号: US12109769申请日: 2008-04-25
-
公开(公告)号: US07899567B2公开(公告)日: 2011-03-01
- 发明人: Masataka Tanaka , Takaaki Kumazawa , Masayuki Ichinohe
- 申请人: Masataka Tanaka , Takaaki Kumazawa , Masayuki Ichinohe
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly & Malur, P.C.
- 优先权: JP2007-117957 20070427
- 主分类号: G06F19/00
- IPC分类号: G06F19/00 ; G01N37/00
摘要:
An inspection-required product selection method and program for minimizing the number of investigation steps at the time of a defect occurrence for a product placed on the market are disclosed. A combination of product lots to be inspected is assumed based on the information on the material lots used for a product lot scheduled for production for a predetermined future period and the number of the product lots inspected during the same period. The number of the material lots not included in the product lots to be inspected is totalized for each product lot, and the statistical values are calculated for all the conceivable combinations of the product lots. The combination of the product lots optimizing the statistical values is selected for inspection.
公开/授权文献
- US20080269936A1 METHOD AND PROGRAM FOR SELECTING PRODUCT TO BE INSPECTED 公开/授权日:2008-10-30
信息查询