发明授权
US07903245B2 Multi-beam optical probe and system for dimensional measurement 有权
多光束光学探针和尺寸测量系统

Multi-beam optical probe and system for dimensional measurement
摘要:
A multi-beam optical probe according to illustrative embodiments of the present invention generally reduce the limitations, difficulties and disadvantages of the conventional measurement devices and techniques by providing a non-contact multi-beam optical probe apparatus and system for the dimensional measurement of objects. The narrow elongated probe provides at least two orthogonal, divergent or parallel laser beams, the reflection of each beam on the object being simultaneously detectable without moving the probe.
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