发明授权
- 专利标题: Capacitor having microstructures
- 专利标题(中): 具有微结构的电容器
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申请号: US12188177申请日: 2008-08-07
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公开(公告)号: US07903387B2公开(公告)日: 2011-03-08
- 发明人: Hidetoshi Masuda , Masaru Kurosawa , Kotaro Mizuno
- 申请人: Hidetoshi Masuda , Masaru Kurosawa , Kotaro Mizuno
- 申请人地址: JP Tokyo
- 专利权人: Taiyo Yuden Co., Ltd.
- 当前专利权人: Taiyo Yuden Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Law Office of Katsuhiro Arai
- 优先权: JP2007-214202 20070820
- 主分类号: H01G4/005
- IPC分类号: H01G4/005
摘要:
A capacitor element includes a pair of conductor layers, a plurality of generally tube-shaped dielectric substances, a first electrode outside the dielectric substances and second electrodes in the insides thereof, and insulation caps for insulating the first electrode from the conductor layer, wherein an electrode material is filled in gaps of a structure of an oxide base material resulting from anodic oxidation of a metal, and then, the structure is removed and replaced by a high permittivity material.
公开/授权文献
- US20090052110A1 CAPACITOR HAVING MICROSTRUCTURES 公开/授权日:2009-02-26
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