发明授权
US07903469B2 Nonvolatile semiconductor memory, its read method and a memory card
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非易失性半导体存储器,其读取方式和存储卡
- 专利标题: Nonvolatile semiconductor memory, its read method and a memory card
- 专利标题(中): 非易失性半导体存储器,其读取方式和存储卡
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申请号: US11838510申请日: 2007-08-14
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公开(公告)号: US07903469B2公开(公告)日: 2011-03-08
- 发明人: Makoto Iwai , Yoshihisa Watanabe
- 申请人: Makoto Iwai , Yoshihisa Watanabe
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2006-227254 20060824
- 主分类号: G11C16/26
- IPC分类号: G11C16/26
摘要:
A nonvolatile semiconductor memory includes a memory cell array having a plurality of NAND cell units which are arranged with a plurality of memory cells connected in series and a first selection transistor and a second selection transistor which are each connected to both ends of the plurality of memory cells respectively, a plurality of word lines and a plurality of bit lines which are connected to the plurality of memory cells and a data read control part wherein at least one of the memory cells is selected and when data is read from that memory cell a read pass voltage is applied to a word line which is connected to a non-selected memory cell other than the selected memory cell, and after applying the read pass voltage a voltage is applied to a control gate of the first selection transistor or the second selection transistor, and when applying the read pass voltage, the read pass voltage which is applied to the word line which is connected to at least one of the non-selected memory cells which is adjacent to the first selection transistor or the second selection transistor, is made lower than the read pass voltage which is applied to the word line which is connected to another cell of the non-selected memory cells.
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