发明授权
- 专利标题: Method and apparatus for displaying detected defects
- 专利标题(中): 用于显示检测到的缺陷的方法和装置
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申请号: US11677669申请日: 2007-02-22
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公开(公告)号: US07903867B2公开(公告)日: 2011-03-08
- 发明人: Kenji Nakahira , Toshifumi Honda
- 申请人: Kenji Nakahira , Toshifumi Honda
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 优先权: JP2006-044645 20060222
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
Defect image display screens are capable of accurately presenting features of defects. On a thumbnail display screen of a defect, images likely to most clearly indicating features of the defect are determined in units of the defect from, for example, inspection information and a defect type, and then are displayed. On a detail display screen of a defect, for example, images for being displayed so as to clearly indicate features of the defect, and the display sequence thereof are determined in accordance with, for example, inspection information and a defect type, and then are displayed. Further, steps for acquiring a display image during or after defect image acquisition by using, for example, a different defect image acquisition apparatus and a different imaging condition in accordance with preliminarily specified rules are added to an imaging sequence (procedure).
公开/授权文献
- US20070194231A1 METHOD AND APPARATUS FOR DISPLAYING DETECTED DEFECTS 公开/授权日:2007-08-23
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