发明授权
- 专利标题: Triple track test for side erase band width and side erase amplitude loss of a recording head
- 专利标题(中): 记录头侧擦除带宽和侧面擦除振幅损耗的三轨测试
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申请号: US12183632申请日: 2008-07-31
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公开(公告)号: US07907361B2公开(公告)日: 2011-03-15
- 发明人: Youping Deng , Mike X. Wang , Jing Zhang
- 申请人: Youping Deng , Mike X. Wang , Jing Zhang
- 申请人地址: NL Amsterdam
- 专利权人: Hitachi Global Storage Technologies, Netherlands B.V.
- 当前专利权人: Hitachi Global Storage Technologies, Netherlands B.V.
- 当前专利权人地址: NL Amsterdam
- 主分类号: G11B27/36
- IPC分类号: G11B27/36
摘要:
A triple track test for determining respective erase band widths associated with a read/write head involves writing first and second data tracks in each direction and at a certain distance from an origin, and erasing a track having a center at the origin. Based on a triple track test profile (3T) corresponding to the three tracks, a first distance is measured in one direction from the origin to one of the modified data tracks and a first erase band width is computed based thereon. The other side erase band width is computable similarly. A side erase amplitude loss measurement procedure, for determining the amount of signal amplitude lost by an adjacent track due to the respective erase bands, involves constructing a side-erase profile based on a composite of the 3T profile and a full-track profile, from which respective amplitude losses are computed for the respective erase bands.
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