发明授权
- 专利标题: Non-volatile semiconductor storage device
- 专利标题(中): 非易失性半导体存储器件
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申请号: US12337808申请日: 2008-12-18
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公开(公告)号: US07911844B2公开(公告)日: 2011-03-22
- 发明人: Dai Nakamura , Hiroyuki Kutsukake , Kenji Gomikawa , Takeshi Shimane , Mitsuhiro Noguchi , Koji Hosono , Masaru Koyanagi , Takashi Aoi
- 申请人: Dai Nakamura , Hiroyuki Kutsukake , Kenji Gomikawa , Takeshi Shimane , Mitsuhiro Noguchi , Koji Hosono , Masaru Koyanagi , Takashi Aoi
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2007-328852 20071220
- 主分类号: G11C16/04
- IPC分类号: G11C16/04
摘要:
A non-volatile semiconductor storage device includes: a memory cell array having memory cells arranged therein, the memory cells storing data in a non-volatile manner; and a plurality of transfer transistors transferring a voltage to the memory cells, the voltage to be supplied for data read, write and erase operations with respect to the memory cells. Each of the transfer transistors includes: a gate electrode formed on a semiconductor substrate via a gate insulation film; and diffusion layers formed to sandwich the gate electrode therebetween and functioning as drain/source layers. Upper layer wirings are provided above the diffusion layers and provided with a predetermined voltage to prevent depletion of the diffusion layers at least when the transfer transistors become conductive.
公开/授权文献
- US20090161427A1 NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE 公开/授权日:2009-06-25
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