发明授权
- 专利标题: Testing processor cores
- 专利标题(中): 测试处理器内核
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申请号: US12128075申请日: 2008-05-28
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公开(公告)号: US07912670B2公开(公告)日: 2011-03-22
- 发明人: Dae Ik Kim , Jonghae Kim , Moon J Kim , James R Moulic
- 申请人: Dae Ik Kim , Jonghae Kim , Moon J Kim , James R Moulic
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Driggs, Hogg, Daugherty & Del Zoppo Co., LPA
- 代理商 Patrick J. Daugherty
- 主分类号: G01R31/00
- IPC分类号: G01R31/00
摘要:
Systems, methods and program codes are provided for testing multi-core processor chip structures. Individual processor core power supply voltages are provided through controlling individual power supplies for each core, in one aspect to ensure that one or more cores operate at clock rates in compliance with one or more performance specifications. In one example, a first power supply voltage supplied to a first processing core differs from a second core power supply voltage supplied to a second processing core, both cores operating in compliance with a reference clock rate specification. Core power supply voltages may be selected from ordered discrete supply voltages derived by progressively raising or lowering a first supply voltage, optionally wherein the selected supply voltage also enables the core to operate within another performance specification.
公开/授权文献
- US20080262777A1 SYSTEM FOR TESTING PROCESSOR CORES 公开/授权日:2008-10-23
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