发明授权
- 专利标题: Random number test circuit
- 专利标题(中): 随机数测试电路
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申请号: US11635590申请日: 2006-12-08
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公开(公告)号: US07917560B2公开(公告)日: 2011-03-29
- 发明人: Mari Matsumoto , Tetsufumi Tanamoto , Shinobu Fujita
- 申请人: Mari Matsumoto , Tetsufumi Tanamoto , Shinobu Fujita
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- 优先权: JP2005-359236 20051213
- 主分类号: G06F1/02
- IPC分类号: G06F1/02
摘要:
The random number test circuit includes a shift register which operates based on a clock and which successively stores serial random numbers generated by a random number generation element, a first random number being output from a predetermined stage of the shift register; a comparison circuit which compares the first random number with a second random number located at a distance of a first predetermined number of bits from the first random number, the second random number being generated by the random number generation element; a counter which counts a frequency of occurrence of equality or inequality between the first random number and the second random number, with respect to all bits in the serial random numbers, and a decision circuit which judges an article quality to be good if a count value in the counter indicates a frequency of occurrence equal to or less than a number determined previously by correlation.
公开/授权文献
- US20070162806A1 Random number test circuit 公开/授权日:2007-07-12