发明授权
- 专利标题： Method and system for parameter extraction of a cutting tool
- 专利标题（中）： 切削刀具参数提取方法和系统
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申请号： US12419051申请日： 2009-04-06
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公开(公告)号： US07924439B2公开(公告)日： 2011-04-12
- 发明人: Tian Chen , Kevin George Harding , Steven Robert Hayashi , Xiaoming Du , Jianming Zheng , Howard Paul Weaver , James Allen Baird , Xinjue Zou , Kevin William Meyer
- 申请人： Tian Chen , Kevin George Harding , Steven Robert Hayashi , Xiaoming Du , Jianming Zheng , Howard Paul Weaver , James Allen Baird , Xinjue Zou , Kevin William Meyer
- 申请人地址： US NY Niskayuna
- 专利权人： General Electric Company
- 当前专利权人： General Electric Company
- 当前专利权人地址： US NY Niskayuna
- 代理商 Penny A. Clarke
- 主分类号： G01B11/24
- IPC分类号： G01B11/24
摘要：
A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.
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