发明授权
- 专利标题: Inspection apparatus using template matching method using similarity distribution
- 专利标题(中): 使用相似度分布的模板匹配方法的检验装置
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申请号: US11836452申请日: 2007-08-09
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公开(公告)号: US07925076B2公开(公告)日: 2011-04-12
- 发明人: Yuichi Abe , Mitsuji Ikeda , Yoshimichi Satou , Yasutaka Toyoda
- 申请人: Yuichi Abe , Mitsuji Ikeda , Yoshimichi Satou , Yasutaka Toyoda
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Crowell & Moring LLP
- 优先权: JP2006-240375 20060905
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
An inspection apparatus performing template matching of a search image capable of outputting a correct matching position even if a pattern similar to a template exists in the search image is provided. The inspection apparatus includes a template cutout means for cutting out a template from a template selection image, a marginal similarity calculation means for calculating marginal similarity distribution information, which is a similarity distribution of the template selection image to the template, a search image similarity calculation part for calculating search image similarity distribution information, which is a similarity distribution of the search image to the template, a similarity distribution-to-similarity distribution similarity calculation means for calculating similarity distribution-to-similarity distribution similarity information between the marginal similarity distribution information and the search image similarity distribution information, and a matching position determination part for determining a matching position based on the similarity distribution-to-similarity distribution similarity.
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