Invention Grant
- Patent Title: Inspection apparatus using template matching method using similarity distribution
- Patent Title (中): 使用相似度分布的模板匹配方法的检验装置
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Application No.: US11836452Application Date: 2007-08-09
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Publication No.: US07925076B2Publication Date: 2011-04-12
- Inventor: Yuichi Abe , Mitsuji Ikeda , Yoshimichi Satou , Yasutaka Toyoda
- Applicant: Yuichi Abe , Mitsuji Ikeda , Yoshimichi Satou , Yasutaka Toyoda
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2006-240375 20060905
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
An inspection apparatus performing template matching of a search image capable of outputting a correct matching position even if a pattern similar to a template exists in the search image is provided. The inspection apparatus includes a template cutout means for cutting out a template from a template selection image, a marginal similarity calculation means for calculating marginal similarity distribution information, which is a similarity distribution of the template selection image to the template, a search image similarity calculation part for calculating search image similarity distribution information, which is a similarity distribution of the search image to the template, a similarity distribution-to-similarity distribution similarity calculation means for calculating similarity distribution-to-similarity distribution similarity information between the marginal similarity distribution information and the search image similarity distribution information, and a matching position determination part for determining a matching position based on the similarity distribution-to-similarity distribution similarity.
Public/Granted literature
- US20080069453A1 Inspection Apparatus Using Template Matching Method Using Similarity Distribution Public/Granted day:2008-03-20
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