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US07925823B2 Reuse of functional data buffers for pattern buffers in XDR DRAM 失效
在XDR DRAM中重用图形缓冲区的功能数据缓冲区

Reuse of functional data buffers for pattern buffers in XDR DRAM
Abstract:
A mechanism is provided to reuse functional data buffers. With Extreme Data Rate (XDR™) Dynamic Random Access Memory (DRAM), test patterns are employed to dynamically calibrate data with the clock. To perform this task, data buffers are employed to store data and commands for the calibration patterns. However, there are different procedures and requirements for transmission and reception calibrations. Hence, to reduce the amount of hardware needed to perform transmission and reception calibrations, the data buffers employ additional front end circuitry to reuse the buffers for both tasks.
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