Invention Grant
US07929346B2 Memory data detecting apparatus and method for controlling reference voltage based on error in stored data
有权
存储器数据检测装置和基于存储数据中的误差来控制参考电压的方法
- Patent Title: Memory data detecting apparatus and method for controlling reference voltage based on error in stored data
- Patent Title (中): 存储器数据检测装置和基于存储数据中的误差来控制参考电压的方法
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Application No.: US12216745Application Date: 2008-07-10
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Publication No.: US07929346B2Publication Date: 2011-04-19
- Inventor: Dong Hun Yu , Kyoung Lae Cho , Dong Hyuk Chae , Jun Jin Kong , Jae Hong Kim , Seung-Hwan Song
- Applicant: Dong Hun Yu , Kyoung Lae Cho , Dong Hyuk Chae , Jun Jin Kong , Jae Hong Kim , Seung-Hwan Song
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2008-0014090 20080215
- Main IPC: G11C16/06
- IPC: G11C16/06 ; G11C16/34 ; G11C16/26

Abstract:
Example embodiments may relate to a method and an apparatus for reading data stored in a memory, for example, providing a method and an apparatus for controlling a reference voltage based on an error of the stored data. Example embodiments may provide a memory data detecting apparatus including a first voltage comparator to compare a threshold voltage of a memory cell with a first reference voltage, a first data determiner to determine a value of at least one data bit stored in the memory cell according to a result of the comparison, an error verifier to verify whether an error occurs in the determined value, a reference voltage determiner to determine a second reference voltage that is lower than the first reference voltage based on a result of the verification, and a second data determiner to re-determine the value of the data based on the determined second reference voltage.
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