发明授权
- 专利标题: Temperature detector in an integrated circuit
- 专利标题(中): 集成电路中的温度检测器
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申请号: US12619157申请日: 2009-11-16
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公开(公告)号: US07929366B2公开(公告)日: 2011-04-19
- 发明人: Chung Zen Chen
- 申请人: Chung Zen Chen
- 申请人地址: CA Ottawa, Ontario
- 专利权人: Mosaid Technologies Incorporated
- 当前专利权人: Mosaid Technologies Incorporated
- 当前专利权人地址: CA Ottawa, Ontario
- 代理机构: Guerin & Rodriguez LLP
- 主分类号: G11C7/04
- IPC分类号: G11C7/04
摘要:
A temperature detector in an integrated circuit comprises a temperature-dependent voltage generator, a ring oscillator, a timer and a clock-driven recorder. The temperature-dependent voltage generator is configured to generate at least one temperature-dependent voltage. The ring oscillator is configured to generate a clock signal, which is affected by one of the at least one temperature-dependent voltage. The timer is configured to generate a time-out signal, which is affected by one of the temperature-dependent voltage. The clock-driven recorder has a clock input terminal in response to the clock signal and time-out signal.
公开/授权文献
- US20100061172A1 TEMPERATURE DETECTOR IN AN INTEGRATED CIRCUIT 公开/授权日:2010-03-11
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