Invention Grant
- Patent Title: Creating novel structures using deep trenching of oriented silicon substrates
- Patent Title (中): 使用定向硅衬底的深沟槽创建新的结构
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Application No.: US11208177Application Date: 2005-08-19
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Publication No.: US07932182B2Publication Date: 2011-04-26
- Inventor: Yong-Fa A. Wang , Richard A. Davis , Larry A. Rehn
- Applicant: Yong-Fa A. Wang , Richard A. Davis , Larry A. Rehn
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Main IPC: H01L21/311
- IPC: H01L21/311

Abstract:
A potassium hydroxide (KOH) etch process can produce deep high aspect ratio trenches in (110) oriented silicon substrates. The trenches, however, are perpendicular to the (111) direction of the silicon substrate's crystal lattice. The trenches are used to produce thermally isolating areas and through the wafer electrical connections. These structures can be produced in a cost effective manner because of the nearly ideal capabilities of the KOH etch process when it is applied to appropriate materials at appropriate orientations.
Public/Granted literature
- US20070042606A1 Creating novel structures using deep trenching of oriented silicon substrates Public/Granted day:2007-02-22
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