发明授权
- 专利标题： Correlated double sampling circuit and sample hold circuit
- 专利标题（中）： 相关双采样电路和采样保持电路
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申请号： US12090310申请日： 2006-10-27
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公开(公告)号： US07932752B2公开(公告)日： 2011-04-26
- 发明人: Makoto Ohba
- 申请人： Makoto Ohba
- 申请人地址： JP Osaka
- 专利权人： Panasonic Corporation
- 当前专利权人： Panasonic Corporation
- 当前专利权人地址： JP Osaka
- 代理机构： McDermott Will & Emery LLP
- 优先权： JP2005-323386 20051108
- 国际申请： PCT/JP2006/321548 WO 20061027
- 国际公布： WO2007/055114 WO 20070518
- 主分类号： G11C27/02
- IPC分类号： G11C27/02 ; H03K5/00 ; H03K17/00
摘要：
A correlated double sampling circuit has a sampling capacitor equally divided into a plurality of portions. In the correlated double sampling circuit, an input signal is sampled at a plurality of sampling points and an averaging switch is closed to obtain an average value of a plurality of sampling values obtained by sampling. High frequency noise superimposed on the input signal is thus reduced and a difference between the average values of the plurality of sampling values obtained by sampling is output.