Invention Grant
- Patent Title: Abnormality diagnosing method for sound or vibration and abnormality diagnosing apparatus for sound or vibration
- Patent Title (中): 用于声音或振动的异常诊断方法和声音或振动的异常诊断装置
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Application No.: US11700188Application Date: 2007-01-31
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Publication No.: US07933742B2Publication Date: 2011-04-26
- Inventor: Hideaki Ishii , Hiroshi Uemura , Zhong Zhang
- Applicant: Hideaki Ishii , Hiroshi Uemura , Zhong Zhang
- Applicant Address: JP Osaka JP Toyohashi-Shi
- Assignee: JTEKT Corporation,Zhong Zhang
- Current Assignee: JTEKT Corporation,Zhong Zhang
- Current Assignee Address: JP Osaka JP Toyohashi-Shi
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2006-025154 20060201
- Main IPC: G06F11/30
- IPC: G06F11/30

Abstract:
A noise detection signal detected at an evaluation point is filtered by a low pass filter, so that an evaluation waveform signal is extracted. A real signal mother wavelet of complex type is derived from the extracted evaluation waveform signal. Using this mother wavelet, an abnormal waveform signal stored in advance is processed by wavelet transformation. Then, a correlation value is calculated between the abnormal waveform signal and the mother wavelet. The correlation value is compared with a predetermined criterion, so that the presence or absence of abnormality in a sound source or vibration source corresponding to each abnormal waveform signal is determined.
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