Invention Grant
- Patent Title: Measuring an appearance property of a surface using a spatially under-sampled bidirectional reflectance distribution function
- Patent Title (中): 使用空间欠采样的双向反射分布函数测量表面的外观性质
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Application No.: US11410451Application Date: 2006-04-25
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Publication No.: US07940396B2Publication Date: 2011-05-10
- Inventor: Jon Kenneth Nisper , Patrick S. Rood , Brett Allen Pawlanta , Thomas M. Richardson , Brian Dale Teunis
- Applicant: Jon Kenneth Nisper , Patrick S. Rood , Brett Allen Pawlanta , Thomas M. Richardson , Brian Dale Teunis
- Applicant Address: US MI Grand Rapids
- Assignee: X-Rite, Inc.
- Current Assignee: X-Rite, Inc.
- Current Assignee Address: US MI Grand Rapids
- Agency: McCarter & English, LLP
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01J3/46

Abstract:
An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.
Public/Granted literature
Information query