Invention Grant
US07940396B2 Measuring an appearance property of a surface using a spatially under-sampled bidirectional reflectance distribution function 有权
使用空间欠采样的双向反射分布函数测量表面的外观性质

Measuring an appearance property of a surface using a spatially under-sampled bidirectional reflectance distribution function
Abstract:
An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.
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