发明授权
- 专利标题: Phase change current density control structure
- 专利标题(中): 相变电流密度控制结构
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申请号: US11304593申请日: 2005-12-16
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公开(公告)号: US07943921B2公开(公告)日: 2011-05-17
- 发明人: Jon Daley , Kristy A. Campbell
- 申请人: Jon Daley , Kristy A. Campbell
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Dickstein Shapiro LLP
- 主分类号: H01L47/00
- IPC分类号: H01L47/00
摘要:
A phase change memory element and method of forming the same. The memory element includes first and second electrodes. A first layer of phase change material is between the first and second electrodes. A second layer including a metal-chalcogenide material is also between the first and second electrodes and is one of a phase change material and a conductive material. An insulating layer is between the first and second layers. There is at least one opening in the insulating layer providing contact between the first and second layers.
公开/授权文献
- US20070158631A1 Phase change current density control structure 公开/授权日:2007-07-12
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