发明授权
- 专利标题: RF detector with crest factor measurement
- 专利标题(中): 具有波峰因数测量的RF检测器
-
申请号: US12645196申请日: 2009-12-22
-
公开(公告)号: US07944196B2公开(公告)日: 2011-05-17
- 发明人: Yalcin Alper Eken , Peter Katzin
- 申请人: Yalcin Alper Eken , Peter Katzin
- 申请人地址: US MA Chelmsford
- 专利权人: Hittite Microwave Corporation
- 当前专利权人: Hittite Microwave Corporation
- 当前专利权人地址: US MA Chelmsford
- 代理机构: Lando & Anastasi, LLP
- 主分类号: G01R19/00
- IPC分类号: G01R19/00
摘要:
An RF detector configured to provide two outputs, one being a function of the true RMS power level of an RF input signal, and the other being a function of the instantaneous/peak power of the RF input signal, normalized to the average power level. The RF detector includes a variable gain detection subsystem including a single detector or detector array that provides a representation of the power level of the RF input signal. The detector or detector array is common to both the RMS power detection channel and the instantaneous/peak power detection channel of the RF detector. A method of RF detection includes providing representations of the RF input signal at different gain levels, selecting one or more of the representations, and averaging the selected signals. The gain levels of the selected representations is adjusted to provide information about the average power level of the RF input signal.
公开/授权文献
- US20100097143A1 RF DETECTOR WITH CREST FACTOR MEASUREMENT 公开/授权日:2010-04-22
信息查询