Invention Grant
- Patent Title: RF detector with crest factor measurement
- Patent Title (中): 具有波峰因数测量的RF检测器
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Application No.: US12645196Application Date: 2009-12-22
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Publication No.: US07944196B2Publication Date: 2011-05-17
- Inventor: Yalcin Alper Eken , Peter Katzin
- Applicant: Yalcin Alper Eken , Peter Katzin
- Applicant Address: US MA Chelmsford
- Assignee: Hittite Microwave Corporation
- Current Assignee: Hittite Microwave Corporation
- Current Assignee Address: US MA Chelmsford
- Agency: Lando & Anastasi, LLP
- Main IPC: G01R19/00
- IPC: G01R19/00

Abstract:
An RF detector configured to provide two outputs, one being a function of the true RMS power level of an RF input signal, and the other being a function of the instantaneous/peak power of the RF input signal, normalized to the average power level. The RF detector includes a variable gain detection subsystem including a single detector or detector array that provides a representation of the power level of the RF input signal. The detector or detector array is common to both the RMS power detection channel and the instantaneous/peak power detection channel of the RF detector. A method of RF detection includes providing representations of the RF input signal at different gain levels, selecting one or more of the representations, and averaging the selected signals. The gain levels of the selected representations is adjusted to provide information about the average power level of the RF input signal.
Public/Granted literature
- US20100097143A1 RF DETECTOR WITH CREST FACTOR MEASUREMENT Public/Granted day:2010-04-22
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