发明授权
US07945403B2 Signal measurement apparatus, signal measurement method, recording media and test apparatus
有权
信号测量装置,信号测量方法,记录介质和测试装置
- 专利标题: Signal measurement apparatus, signal measurement method, recording media and test apparatus
- 专利标题(中): 信号测量装置,信号测量方法,记录介质和测试装置
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申请号: US12116972申请日: 2008-05-08
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公开(公告)号: US07945403B2公开(公告)日: 2011-05-17
- 发明人: Masahiro Ishida , Atsuya Ono
- 申请人: Masahiro Ishida , Atsuya Ono
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Jianq Chyun IP Office
- 主分类号: G01R13/00
- IPC分类号: G01R13/00 ; G06F17/00
摘要:
Provided is a signal measurement apparatus, including sampling sections that each sample a signal under measurement having a cycle T with a threshold value, where the threshold values of at least two of the sampling sections are different from each other; a waveform reconfiguring section that shapes a reconfigured waveform having the cycle T by rearranging ordinal ranks of sample values corresponding to each threshold value obtained by the sampling sections, a distribution generating section that generates a timing distribution of edges in the reconfigured waveform corresponding to each threshold value; and a calculating section that calculates rise time or fall time of the signal under measurement based on the timing distribution corresponding to each threshold value.
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