A method to validate data used in a design of a semiconductor product currently in a partially fabricated state is disclosed. The partially fabricated state having a plurality of layers up to and including a first conductive layer. The method generally includes the steps of (A) adding a second conductive layer from a user specification to an application set, the application set having a plurality of resources that define the semiconductor product, (B) validating a new resource in the user specification against the resources in the application set, (C) adding the new resource to the application set upon passing the validating and (D) propagating the new resource throughout a description of the semiconductor product, the description being stored in a computer-readable medium.