Invention Grant
US07948228B2 Technique for measuring power source noise generated inside integrated circuit
有权
用于测量集成电路内部产生的电源噪声的技术
- Patent Title: Technique for measuring power source noise generated inside integrated circuit
- Patent Title (中): 用于测量集成电路内部产生的电源噪声的技术
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Application No.: US12614641Application Date: 2009-11-09
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Publication No.: US07948228B2Publication Date: 2011-05-24
- Inventor: Takahito Takemoto , Akihiko Harada , Kazuhiro Furuya
- Applicant: Takahito Takemoto , Akihiko Harada , Kazuhiro Furuya
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2006-259211 20060925
- Main IPC: G01R19/00
- IPC: G01R19/00 ; G01R31/26

Abstract:
To accurately measure power source noise generated inside an integrated circuit, the power source noise measuring device comprises: a mutual inductor pair placed inside an integrated circuit, the mutual inductor pair including (i) a first inductor connected to between power source voltages of the integrated circuit and (ii) a second inductor arranged opposite the first inductor, the both ends of which second inductor are connected to external output terminals; and a power source noise measuring unit which measures power source noise of the integrated circuit on the basis of a voltage waveform output from the second inductor of said mutual inductor pair via the external output terminals.
Public/Granted literature
- US20100052726A1 POWER SOURCE NOISE MEASURING DEVICE, INTEGRATED CIRCUIT, AND SEMICONDUCTOR DEVICE Public/Granted day:2010-03-04
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