发明授权
- 专利标题: Position accuracy evaluation method and position accuracy evaluation apparatus
- 专利标题(中): 位置精度评估方法和位置精度评估装置
-
申请号: US11375812申请日: 2006-03-15
-
公开(公告)号: US07948516B2公开(公告)日: 2011-05-24
- 发明人: Yutaka Unno , Taiji Kiku
- 申请人: Yutaka Unno , Taiji Kiku
- 申请人地址: JP Nagoya
- 专利权人: NGK Insulators, Ltd.
- 当前专利权人: NGK Insulators, Ltd.
- 当前专利权人地址: JP Nagoya
- 代理机构: Burr & Brown
- 优先权: JP2005-077929 20050317
- 主分类号: H04N7/18
- IPC分类号: H04N7/18 ; H05B3/68
摘要:
According to a related art for evaluating the position accuracy of heaters with respect to the plate, it is necessary to attach an energizing electrode to the heaters, and energize the heaters for a predetermined period to heat the entire plate, before measuring the temperature distribution map. Therefore, there is a problem in that several tens of minutes are required until the temperature distribution map can be measured. As the plate becomes larger, the time required for energizing the heaters to heat the entire plate becomes longer. A technique for evaluating the position accuracy of heaters with respect to the plate, without executing a process for energizing the heaters to heat the plate is disclosed.
公开/授权文献
信息查询