发明授权
US07948799B2 Structure and method of sub-gate NAND memory with bandgap engineered SONOS devices 有权
具有带隙工程SONOS器件的子门NAND存储器的结构和方法

Structure and method of sub-gate NAND memory with bandgap engineered SONOS devices
摘要:
A bandgap engineered SONOS device structure for design with various AND architectures. The BE-SONOS device structure comprises a spacer oxide disposed between a control gate overlaying an oxide-nitride-oxide-nitride-oxide stack and a sub-gate overlaying a gate oxide. In one example, a BE-SONOS sub-gate-AND array architecture has multiple strings of SONONOS devices with sub-gate lines and diffusion bit lines. In another example, a BE-SONOS sub-gate-AND architecture has multiple strings of SONONOS devices with sub-gate lines, relying on the sub-gate lines that create inversions to substitute for the diffusion bit lines.
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