发明授权
US07948799B2 Structure and method of sub-gate NAND memory with bandgap engineered SONOS devices
有权
具有带隙工程SONOS器件的子门NAND存储器的结构和方法
- 专利标题: Structure and method of sub-gate NAND memory with bandgap engineered SONOS devices
- 专利标题(中): 具有带隙工程SONOS器件的子门NAND存储器的结构和方法
-
申请号: US12175297申请日: 2008-07-17
-
公开(公告)号: US07948799B2公开(公告)日: 2011-05-24
- 发明人: Hang-Ting Lue , Hao Ming Lien
- 申请人: Hang-Ting Lue , Hao Ming Lien
- 申请人地址: TW Hsinchu
- 专利权人: Macronix International Co., Ltd.
- 当前专利权人: Macronix International Co., Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Kenta Suzue Haynes Beffel & Wolfeld LLP
- 主分类号: G11C11/34
- IPC分类号: G11C11/34 ; G11C16/04 ; G11C16/06
摘要:
A bandgap engineered SONOS device structure for design with various AND architectures. The BE-SONOS device structure comprises a spacer oxide disposed between a control gate overlaying an oxide-nitride-oxide-nitride-oxide stack and a sub-gate overlaying a gate oxide. In one example, a BE-SONOS sub-gate-AND array architecture has multiple strings of SONONOS devices with sub-gate lines and diffusion bit lines. In another example, a BE-SONOS sub-gate-AND architecture has multiple strings of SONONOS devices with sub-gate lines, relying on the sub-gate lines that create inversions to substitute for the diffusion bit lines.
公开/授权文献
信息查询