Invention Grant
- Patent Title: Phase-change nonvolatile memory device using Sb-Zn alloy
- Patent Title (中): 使用Sb-Zn合金的相变非易失性存储器件
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Application No.: US12122152Application Date: 2008-05-16
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Publication No.: US07952086B2Publication Date: 2011-05-31
- Inventor: Byoung Gon Yu , Sung Min Yoon , Se Young Choi , Tae Jin Park
- Applicant: Byoung Gon Yu , Sung Min Yoon , Se Young Choi , Tae Jin Park
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Kile Park Goekjian Reed & McManus PLLC
- Priority: KR10-2007-0047526 20070516
- Main IPC: H01L45/00
- IPC: H01L45/00

Abstract:
Provided are a phase-change nonvolatile memory device and a manufacturing method thereof. The device includes: a substrate; and a stack structure disposed on the substrate and including a phase-change material layer. The phase-change material layer is formed of an alloy of antimony (Sb) and zinc (Zn), so that the phase-change memory device can stably operate at high speed and reduce power consumption.
Public/Granted literature
- US20080283817A1 PHASE-CHANGE NONVOLATILE MEMORY DEVICE USING Sb-Zn ALLOY AND MANUFACTURING METHOD THEREOF Public/Granted day:2008-11-20
Information query
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