发明授权
- 专利标题: No-disturb bit line write for improving speed of eDRAM
- 专利标题(中): 无干扰位线写入以提高eDRAM的速度
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申请号: US12055095申请日: 2008-03-25
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公开(公告)号: US07952946B2公开(公告)日: 2011-05-31
- 发明人: Subramani Kengeri , Kuoyuan (Peter) Hsu , Bing Wang
- 申请人: Subramani Kengeri , Kuoyuan (Peter) Hsu , Bing Wang
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater & Matsil, L.L.P.
- 主分类号: G11C7/00
- IPC分类号: G11C7/00
摘要:
A method of operating a memory circuit includes providing the memory circuit. The memory circuit includes a memory cell; a word line connected to the memory cell; a first local bit line and a second local bit line connected to the memory cell; and a first global bit line and a second global bit line coupled to the first and the second local bit lines, respectively. The method further includes starting an equalization to equalize voltages on the first and the second local bit lines; stopping the equalization; and after the step of starting the equalization and before the step of stopping the equalization, writing values from the first and the second global bit lines to the first and the second local bit lines.
公开/授权文献
- US20090141568A1 No-Disturb Bit Line Write for Improving Speed of eDRAM 公开/授权日:2009-06-04
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