发明授权
- 专利标题: Eyelid detection apparatus, eyelid detection method and program therefor
- 专利标题(中): 眼睑检测装置,眼睑检测方法及程序
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申请号: US12047612申请日: 2008-03-13
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公开(公告)号: US07957566B2公开(公告)日: 2011-06-07
- 发明人: Tomoharu Suzuki , Takashi Hiramaki , Jun Adachi , Kenichi Ohue , Yuji Ninagawa , Kentaro Takahashi , Shigeyasu Uozumi , Satoru Nakanishi , Shinichi Kojima
- 申请人: Tomoharu Suzuki , Takashi Hiramaki , Jun Adachi , Kenichi Ohue , Yuji Ninagawa , Kentaro Takahashi , Shigeyasu Uozumi , Satoru Nakanishi , Shinichi Kojima
- 申请人地址: JP Aichi-ken JP Aichi-ken
- 专利权人: Aisin Seiki Kabushiki Kaisha,Toyota Jidosha Kabushiki Kaisha
- 当前专利权人: Aisin Seiki Kabushiki Kaisha,Toyota Jidosha Kabushiki Kaisha
- 当前专利权人地址: JP Aichi-ken JP Aichi-ken
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2007-066780 20070315
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
An eyelid detection apparatus includes a face-image storing apparatus for storing an image of a face of a subject, an eyelid-candidate extracting apparatus for processing the image stored in the face-image storing apparatus to extract a pair of lines, which becomes a candidate of a combination of a line corresponding to an upper eyelid and a line corresponding to a lower eyelid, a parameter calculating apparatus for calculating a parameter, which indicates a possibility that a pan of the image stored in the face-image storing apparatus, the part corresponding to the pair of lines extracted by the eyelid-candidate extracting apparatus, includes at least one of outer and inner corners of an eye, and an eyelid detecting apparatus for detecting a position of an eyelid of the subject on the basis of the parameter calculated by the parameter calculating apparatus.
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