Invention Grant
- Patent Title: Scanning measurement instrument
- Patent Title (中): 扫描测量仪器
-
Application No.: US12388840Application Date: 2009-02-19
-
Publication No.: US07958564B2Publication Date: 2011-06-07
- Inventor: Takashi Noda , Hiroshi Kamitani , Naoya Kikuchi
- Applicant: Takashi Noda , Hiroshi Kamitani , Naoya Kikuchi
- Applicant Address: JP Kawasaki-shi
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2008-040059 20080221
- Main IPC: G01B5/004
- IPC: G01B5/004

Abstract:
A scanning measurement instrument is capable of simultaneously achieving both higher accuracy and higher speed in autonomous scanning measurement. The instrument includes a path information holding unit for holding information about the path of the center position of a tip of a scanning probe at past tip center positions with respect to the current tip center position during autonomous scanning measurement performed with the scanning probe; a path reference direction setting unit for setting an approximate straight line direction of the path as a path reference direction; a traveling direction setting unit for setting the path reference direction as a traveling direction; a movement control unit for controlling a moving unit such that the scanning probe is moved in the traveling direction; and a normal direction setting unit for setting the normal direction of a measurement surface according to the traveling direction.
Public/Granted literature
- US20090217426A1 SCANNING MEASUREMENT INSTRUMENT Public/Granted day:2009-08-27
Information query