发明授权
- 专利标题: Sample analyzer and sample analyzing method
- 专利标题(中): 样品分析仪和样品分析方法
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申请号: US12012431申请日: 2008-01-31
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公开(公告)号: US07962292B2公开(公告)日: 2011-06-14
- 发明人: Naohiko Matsuo , Hiroyuki Fujino , Mitsuyo Koya , Susumu Hoshiko
- 申请人: Naohiko Matsuo , Hiroyuki Fujino , Mitsuyo Koya , Susumu Hoshiko
- 申请人地址: JP Kobe
- 专利权人: Sysmex Corporation
- 当前专利权人: Sysmex Corporation
- 当前专利权人地址: JP Kobe
- 代理机构: Brinks Hofer Gilson & Lione
- 优先权: JP2007-020942 20070131
- 主分类号: G01N31/00
- IPC分类号: G01N31/00
摘要:
A sample analyzer optically measures reaction of a sample mixed with reagent, and obtains optical information therefrom; generates a reaction curve representing change in the optical information over time; determines a first area prior to an evaluation target time (t0) and a second area after the evaluation target time (t0) wherein the first and second areas are formed between a baseline which is parallel to the time axis and a reaction curve from a first time (t1) prior to the optional evaluation target time (t0) to a second time (t2) after the evaluation target time, and determines the reaction end point based on the first and second areas; and obtains a characteristic of a sample based on the determined reaction end point, is disclosed. a sample analyzing method is also disclosed.
公开/授权文献
- US20080183431A1 Sample analyzer and sample analyzing method 公开/授权日:2008-07-31
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